August_EDFA_Digital

SEMICONDUCTOR YIELD MODELING: A PRIMER 4 ULTRASONIC BEAM INDUCE D RESISTANCE CHANGE 18 LOCATING FAILURES IN CURRENT DEVICE NODES 24 RECENT TRENDS IN COUNTERFEIT ELECTRONIC P ARTS 10 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS AUGUST 2018 | VOLUME 20 | ISSUE 3 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS IN THIS ISSUE...